| BODY HEIGHT | 0.200 INCHES MINIMUM AND 0.220 INCHES MAXIMUM |
| BODY LENGTH | 1.660 INCHES MINIMUM AND 1.680 INCHES MAXIMUM |
| BODY WIDTH | 0.585 INCHES MINIMUM AND 0.605 INCHES MAXIMUM |
| CRITICALITY CODE JUSTIFICATION | FEAT |
| CURRENT RATING PER CHARACTERISTIC | 5.00 MICROAMPERES MAXIMUM INPUT |
| FEATURES PROVIDED | BURN IN, MIL-STD-883, CLASS B AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND RADIATION HARDENED AND ULTRAVIOLET ERASABLE AND TESTED TO MIL-STD-883 AND SELECTED ITEM |
| INCLOSURE CONFIGURATION | DUAL-IN-LINE |
| INCLOSURE MATERIAL | CERAMIC |
| PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT,PROM,128K X 8 (27C010); MICROCIRCUIT,MEMORY DIGITAL,CMOS 128K X 8-BIT UVEPROM,MONOLITHIC SILICON |
| MAXIMUM POWER DISSIPATION RATING | 330.0 MILLIWATTS |
| MEMORY CAPACITY | 128K X 8 |
| MEMORY DEVICE TYPE | EPROM |
| NUCLEAR HARDNESS CRITICAL FEATURE | HARDENED |
| OPERATING TEMP RANGE | -55.0 TO 125.0 CELSIUS |
| OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| SPECIAL FEATURES | ELECTROSTATIC DISCHARGE SENS/HARDNESS CRITICAL ITEM; SELECTED ITEM; SELECTED FROM P/N 5962-8961404MXX OR 5962-8961405MXX,CAGE 67268 |
| SPECIAL TEST FEATURES | SELECTED AND TESTED FOR RADIATION HARDNESS |
| STORAGE TEMP RANGE | -65.0 TO 150.0 CELSIUS |
| TERMINAL SURFACE TREATMENT | SOLDER |
| TERMINAL TYPE AND QUANTITY | 32 PRINTED CIRCUIT |
| TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
| TIME RATING PER CHACTERISTIC | 150.00 NANOSECONDS MINIMUM ACCESS AND 170.00 NANOSECONDS MAXIMUM ACCESS |
| VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.6 VOLTS MINIMUM TOTAL SUPPLY AND 7.0 VOLTS MAXIMUM TOTAL SUPPLY |